AgilentN7788BD台式光学元件分析仪N7788BD

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AgilentN7788BD台式光学元件分析仪N7788BD

AgilentN7788BD台式光学元件分析仪N7788BD刘艳
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主要特性与技术指标 Key Benefits
•Highest Ac c uracy in a single sweep: no averaging over multiple sweeps required
•High measurement speed
•Complete measurement across C/L-band in less than 10 seconds (no need to wait for many averages)
•Robustness against fiber movement / vibration and drift
描述
Agilent Technologies pushes the limits of c o mponent measurements with the N7788BD Component Analyzer. Its proprietary technology is c o mparable with the well-known Jones-Matrix-Eigenanalysis (JME) which is the standard method for measuring Polarization Mode Dispersion (PMD) or differential group delay (DGD) of optical devices.

Agilent’s new single scan technology offers a range of advantages to test a c o mplete set of parameters:

•DGD/ PMD
•PDL
•Power / Loss
•TE / TM-Loss
•2nd-order PMD
•Principal States of Polarization (PSPs)
•Jones and Mueller Matrices
Designed for the Manufacturing Floor

High throughput: A c o mplete analysis across the C and the L band is performed in less than 10 seconds!

Soft w are Drivers: A range of soft w are drivers is available for external control of the system. This allows easy integration in c o mmon ERP systems.

Remote control: Control of the instrument through LAN or via the Intern e t is supported. Thi

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