advantestT5503HS高速存储器测试系统

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advantestT5503HS高速存储器测试系统

advantest T5503HS 高速存储器测试系统维修T5503HS租售T5503HST5503HS价格Memory Test Systemsimg_T5503HS_02 Delivers Performance and Speed Needed to Test DDR4 and LPDDR4 Memory ICs Used Throughout Portable Electronics and ServersWith today’s mobile electronic devices and the servers that support them handling ever-increasing volumes of data, semiconductor memory manufacturers need a highly capable, cost-efficient means of testing their latest generations of high-speed, high-capacity memory ICs – including emerging DDR4-SDRAM and LPDDR4-SDRAM chips.Advantest’s T5503HS tester gives memory manufacturers that industry-leading performance and a low cost of test along with an upgradeable system design.High-speed test solution up to 4.5 GbpsAdvantest’s T5503HS system provides an optimal test solution for double-data-rate SDRAMs and other next-generation memory chips. The tester can operate at speeds up to 4.5 Gbps, fast enough to perform full-coverage testing of the most advanced memories. In addition, the system uses individual level settings and data-bus inversion (DBI) to maximize throughput in testing high-speed devices. To further enhance test performance, the T5503HS automatically generates cyclic redundancy check (CRC) codes and command/address (CA) parity codes to match the I/O data rates and address of any DUT. This enables quick and efficient development of new test programs, which reduces the demands on customers’ resources while also improving the time to market for new semiconductor designs.Capable of testing up to 512 DDR4-SDRAM devices in parallelOptimized for productivity, the T5503HS is a cost-effective, high-volume test solution capable of testing up to 512 DDR4-SDRAM devices in parallel. The system’s real-time source-synchronous function enables high throughput. Additionally, an advanced timing-training capability helps to identify the most effective test solution faster than other systems on the global market. Together, these functions allow the T5503HS tester to achieve much higher productivity than software-based systems.Full compatibility as an upgrade on Advantest’s T5503 test platformWith its modular architecture, the T5503HS is designed to help customers get the most value from their capital investments. The system is available as a fully compatible upgrade on Advantest’s field-proven T5503 test platform. This enables users to extend the performance of their existing testers while also getting greater ROI as next-generation ICs are introduced.Target Devices DDR4-SDRAM, LPDDR4-SDRAM, etc.Parallel Testing Up to 512 devices per systemTest Speed Up to 4.5 Gbps北京Agilent 54832B 示波器
Agilent 54832D 混合信号示波器
Agilent 54845A 混合信号示波器
Agilent 54846A 示波器
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Agilent 54852A 示波器
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Lecroy 64XS 64XS 示波器
力科lecroy 7100A 数字示波器
Agilent 86100A 眼图仪主机
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keysight 86100D Infiniium DCA-X 宽带宽示波器主机
Yokogawa DL9140 DL9140 示波器
Tektronix DPO2000B 示波器
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Tektronix DSA90254A 数字采样示波器
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Keysight DSA90604A Infiniium 示波器
Agilent DSA90804A
Agilent DSA91304A
Agilent DSAV134A
Agilent DSAV204A
Agilent DSAV334A
Keysight DSAZ204A Infiniium V 系列示波器
Keysight DSAZ254A Infiniium V 系列示波器
Keysight DSAZ334A Infiniium V 系列示波器
Keysight DSAZ504A Infiniium V 系列示波器
Keysight DSAZ592A Infiniium V 系列示波器
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Agilent DSAZ632A
Keysight DSAZ634A Infiniium 示波器
Keysight DSO1002A Infiniium 示波器
Keysight DSO1004A Infiniium 示波器
Keysight DSO1014A Infiniium 示波器
Keysight DSO1052B Infiniium 示波器
Keysight DSO1072B Infiniium Oscilloscope
Keysight DSO1102B Infiniium 示波器
Keysight DSO1152B Infiniium 示波器
Agilent DSO3062A
Keysight DSO5032A 示波器
Keysight DSO5054A 示波器
Keysight DSO6032A-903-2ML 示波器
Keysight DSO6032A-903-8ML 示波器
Keysight DSO6034A-903 示波器
Keysight DSO6034A-903-2ML 示波器
Agilent DSO6052A
Agilent DSO6052A-8MH
Agilent DSO6054L
Agilent DSO6102A
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Agilent DSO7012A
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Agilent DSO7104A-001-N5416A
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DSO81204B
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Agilent D